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Publications::
Koehl, A.; Wasmund, H.; Herpers, A.; Guttmann, P.; Werner, S.; Henzler, K.; Du, H.; Mayer, J.; Waser, R.; Dittmann, R. Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy APL Mater. 1 (2013), 042102-1 Transmission X-ray microscopy is employed to detect nanoscale valence changes
in resistive switching SrTiO3 thin film devices. By recording Ti L-edge spectra
of samples in different resistive states, we could show that some spots with
slightly distorted structure and a small reduction to Ti3+ are already present in
the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different
degrees while the remaining film persists in the Ti4+ configuration. These
observations are consistent with a self-accelerating reduction within pre-reduced extended
growth defects. View/Download |
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